@proceedings {4481,
	title = {Prognostics Approach for Power MOSFET under Thermal-Stress Aging},
	journal = {IEEE - The Annual Reliability and Maintainability Symposium},
	year = {2012},
	month = {01/2012},
	publisher = {IEEE},
	address = {Reno, Nevada},
	author = {Jose Celaya and Saxena Abhinav and Kulkarni, Chetan and Saha Sankalita and Goebel Kai}
}
