<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>32</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Davis, James</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Integrated Safety, Reliability, and Diagnostics of High Assurance, High Consequence Systems</style></title><secondary-title><style face="normal" font="default" size="100%">PhD Dissertation</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2000</style></year><pub-dates><date><style  face="normal" font="default" size="100%">May</style></date></pub-dates></dates><urls><related-urls><url><style face="normal" font="default" size="100%">https://archive.isis.vanderbilt.edu/sites/default/files/Davis_J_0_0_2000_Integrated.pdf</style></url></related-urls></urls><publisher><style face="normal" font="default" size="100%">Vanderbilt University</style></publisher><language><style face="normal" font="default" size="100%">eng</style></language><notes><style face="normal" font="default" size="100%">Electrical Engineering</style></notes></record></records></xml>