<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>10</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Jose Celaya</style></author><author><style face="normal" font="default" size="100%">Saxena Abhinav</style></author><author><style face="normal" font="default" size="100%">Kulkarni, Chetan</style></author><author><style face="normal" font="default" size="100%">Saha Sankalita</style></author><author><style face="normal" font="default" size="100%">Goebel Kai</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Prognostics Approach for Power MOSFET under Thermal-Stress Aging</style></title><secondary-title><style face="normal" font="default" size="100%">IEEE - The Annual Reliability and Maintainability Symposium</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2012</style></year><pub-dates><date><style  face="normal" font="default" size="100%">01/2012</style></date></pub-dates></dates><publisher><style face="normal" font="default" size="100%">IEEE</style></publisher><pub-location><style face="normal" font="default" size="100%">Reno, Nevada</style></pub-location></record></records></xml>