Integrated Diagnostic/Prognostic Experimental Setup for Capacitor Degradation and Health Monitoring
Fri, 10/15/2010 - 2:31pm
| Title | Integrated Diagnostic/Prognostic Experimental Setup for Capacitor Degradation and Health Monitoring |
| Publication Type | Conference Proceedings |
| Year of Conference | 2010 |
| Authors | Kulkarni, C., G. Biswas, X. Koutsoukos, C. Jose, and K. Goebel |
| Conference Name | IEEE AUTOTESTCON 2010 |
| Date Published | 09/2010 |
| Publisher | IEEE |
| Conference Location | Orlando, FL |
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