| Title | Diagnostic/Prognostic Experiments for Capacitor Degradation and Health Monitoring in DC-DC converters |
| Publication Type | Conference Paper |
| Year of Publication | 2010 |
| Authors | Kulkarni, C., G. Biswas, X. Koutsoukos, J. Celaya, and K. Goebel |
| Refereed Designation | Refereed |
| Conference Name | ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems |
| Date Published | 10/2010 |
| Publisher | ASME |
| Conference Location | Philadelphia, PA |
| Other Numbers | SMASIS2010-3862 |