Title | Diagnostic/Prognostic Experiments for Capacitor Degradation and Health Monitoring in DC-DC converters |
Publication Type | Conference Paper |
Year of Publication | 2010 |
Authors | Kulkarni, C., G. Biswas, X. Koutsoukos, J. Celaya, and K. Goebel |
Refereed Designation | Refereed |
Conference Name | ASME 2010 Conference on Smart Materials, Adaptive Structures and Intelligent Systems |
Date Published | 10/2010 |
Publisher | ASME |
Conference Location | Philadelphia, PA |
Other Numbers | SMASIS2010-3862 |