Prognostics Health Management and Failure Analysis Modeling techniques for Accelerated Life testing in Electrolytic Capacitors
Fri, 08/12/2011 - 2:17pm
| Title | Prognostics Health Management and Failure Analysis Modeling techniques for Accelerated Life testing in Electrolytic Capacitors |
| Publication Type | Conference Paper |
| Year of Publication | 2011 |
| Authors | Kulkarni, C., G. Biswas, C. Jose, and G. Kai |
| Conference Name | IEEE 2011 Workshop on Accelerated Stress Testing & Reliability |
| Date Published | 10/2011 |
| Publisher | IEEE |
| Conference Location | San Francisco, CA |
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