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2013
Jose, C., C. Kulkarni, G. Biswas, and G. Kai, "Prognostic Studies and Physics of failure mod- eling under High Electrical Stress for Electrolytic Capacitors", International Journal of Prognostics and Health Management, vol. 4, no. 2013, 2013.
2012
Kulkarni, C., C. Jose, G. Biswas, and G. Kai, "Accelerated Aging Experiments for Capacitor Health Monitoring and Prognostics", IEEE AUTOTESTCON, Anaheim, CA, IEEE, 09/2012.
Kulkarni, C., C. Jose, G. Biswas, and G. Kai, "Bayesian Framework Approach for Prognostic Studies in Electrolytic Capacitor under Thermal Overstress Conditions", Annual Conference of the Prognostics and Health Management Society, Minneapolis, MN, PHM Society, 09/2012. Abstract
Celaya, J., S. Abhinav, C. Kulkarni, S. Sankalita, and G. Kai, "Prognostics Approach for Power MOSFET under Thermal-Stress Aging", IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
2011
Jose, C., C. Kulkarni, G. Biswas, S. Sankalita, and G. Kai, "A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging", Annual Conference of the Prognostics and Health Management Society (PHM 2011), Montreal, Canada, Prognostics and Health Management Society, 10/2011.
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostics Health Management and Failure Analysis Modeling techniques for Accelerated Life testing in Electrolytic Capacitors", IEEE 2011 Workshop on Accelerated Stress Testing & Reliability, San Francisco, CA, IEEE, 10/2011.
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostic Modeling and Experimental Techniques for Electrolytic Capacitor Health Monitoring", 8th International Workshop on Structural Health Monitoring, IWSHM 2011, Stanford, CA, 09/2011.
Jose, C., C. Kulkarni, G. Biswas, and G. Kai, "Towards Prognostics of Electrolytic Capacitors", Infotech@Aerospace 2011, St. Louis, Missouri, AIAA, 04/2011.
Kulkarni, C., G. Biswas, C. Jose, and G. Kai, "Prognostics Techniques For Capacitor Degradation and Health Monitoring", The Maintenance & Reliability Conference, MARCON 2011, Knoxville, TN, MARCON, 03/2011. Abstract  Download: MARCON_2011_Kulkarni_Biswas_Celaya_Goebel.pdf (367.09 KB)
2010
Kulkarni, C., G. Biswas, X. Koutsoukos, G. Kai, and C. Jose, "Physics of Failure Models for Capacitor Degradation in DC-DC Converters", The Maintenance & Reliability Conference, MARCON 2010, Knoxville, TN, MARCON, 02/2010. Abstract  Download: KulkarniBiswasKoutsoukos_GoebelCelaya_MARCON2010.pdf (337.41 KB)