Accelerated Aging Experiments for Capacitor Health Monitoring and Prognostics
Tue, 07/17/2012 - 12:50pm
| Title | Accelerated Aging Experiments for Capacitor Health Monitoring and Prognostics |
| Publication Type | Conference Proceedings |
| Year of Conference | 2012 |
| Authors | Kulkarni, C., C. Jose, G. Biswas, and G. Kai |
| Refereed Designation | Refereed |
| Conference Name | IEEE AUTOTESTCON |
| Date Published | 09/2012 |
| Publisher | IEEE |
| Conference Location | Anaheim, CA |
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