Prognostics Approach for Power MOSFET under Thermal-Stress Aging
Tue, 12/06/2011 - 4:14pm
| Title | Prognostics Approach for Power MOSFET under Thermal-Stress Aging |
| Publication Type | Conference Proceedings |
| Year of Conference | 2012 |
| Authors | Celaya, J., S. Abhinav, C. Kulkarni, S. Sankalita, and G. Kai |
| Conference Name | IEEE - The Annual Reliability and Maintainability Symposium |
| Date Published | 01/2012 |
| Publisher | IEEE |
| Conference Location | Reno, Nevada |
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