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Filters: Author is Saxena Abhinav  [Clear All Filters]
2012
Celaya, J., S. Abhinav, C. Kulkarni, S. Sankalita, and G. Kai, "Prognostics Approach for Power MOSFET under Thermal-Stress Aging", IEEE - The Annual Reliability and Maintainability Symposium, Reno, Nevada, IEEE, 01/2012.
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